Günther Bauer, A. Daniel, J. Grenzer, U. Pietsch, T. Roch, Friedrich Schäffler, Christoph Schelling, S. Senz, Y. Zhuang,
"Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution x-ray diffraction"
, in MRS Online Proceedings Library , 2000, Y. Zhuang, C. Schelling, T. Roch, A. Daniel, F. Schäffler, G. Bauer, J. Grenzer, U. Pietsch, S. Senz: Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution x-ray diffraction, Mat. Res. Soc. Symp. Proc. 590, 207-212 (2000).
Original Titel:
Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution x-ray diffraction
Sprache des Titels:
Englisch
Journal:
MRS Online Proceedings Library
Erscheinungsjahr:
2000
Notiz zum Zitat:
Y. Zhuang, C. Schelling, T. Roch, A. Daniel, F. Schäffler, G. Bauer, J. Grenzer, U. Pietsch, S. Senz: Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution x-ray diffraction, Mat. Res. Soc. Symp. Proc. 590, 207-212 (2000).
Forschungs-