Günther Bauer, N. Darowski, J. Grenzer, Vaclav Holy, U. Pietsch, Friedrich Schäffler, Julian Stangl, Stefan Zerlauth, Y. Zhuang,
"In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction"
, in Physica B, 2000, Y. Zhuang, U. Pietsch, J. Stangl, V. Holy, N. Darowski, J. Grenzer, S. Zerlauth, F. Schäffler, G. Bauer: In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction, Physica B 283 (1-3), 130-134 (2000).
Original Titel:
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
Sprache des Titels:
Englisch
Journal:
Physica B
Erscheinungsjahr:
2000
Notiz zum Zitat:
Y. Zhuang, U. Pietsch, J. Stangl, V. Holy, N. Darowski, J. Grenzer, S. Zerlauth, F. Schäffler, G. Bauer: In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction, Physica B 283 (1-3), 130-134 (2000).
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-