P. Kregsamer, C. Streli, P. Wobrauschek, H. Gatterbauer, P. Pianetta, Leopold Palmetshofer, Lora L. Brehm,
"Synchotron Radiation Excited Glancing Incidence XRF for Depth Profile and Thin Film Analysis of Light Elements"
, in X-Ray Spectrometry, Vol. 28, Nummer 4, Seite(n) 292-296, 1999, P.Kregsamer, Ch. Streli, P. Wobrauschek, H. Gatterbauer, P. Pianetta, L. Palmetshofer, L.L. Brehm Synchotron Radiation Excited Glancing Incidence XRF for Depth Profile and Thin Film Analysis of Light Elements X-Ray Spectrometry 28, 292 (1999)
Original Titel:
Synchotron Radiation Excited Glancing Incidence XRF for Depth Profile and Thin Film Analysis of Light Elements
Sprache des Titels:
Englisch
Journal:
X-Ray Spectrometry
Volume:
28
Number:
4
Seitenreferenz:
292-296
Erscheinungsjahr:
1999
Notiz zum Zitat:
P.Kregsamer, Ch. Streli, P. Wobrauschek, H. Gatterbauer, P. Pianetta, L. Palmetshofer, L.L. Brehm Synchotron Radiation Excited Glancing Incidence XRF for Depth Profile and Thin Film Analysis of Light Elements X-Ray Spectrometry 28, 292 (1999)