Günther Bauer, A. A. Darhuber, N. Darowski, Vaclav Holy, D. Lübbert, U. Pietsch, Friedrich Schäffler, Julian Stangl, I. Vavra, Stefan Zerlauth,
"Coplanar and grazing incidence x-ray diffraction investigation of self-organized SiGe quantum dot multilayers"
, in Physical Review B: Condensed Matter and Materials Physics, 1998, "V. Holy, A.A. Darhuber, J. Stangl, S. Zerlauth, F. Schäffler, G. Bauer, N. Darowski, D. Lübbert, U. Pietsch, I. Vavra: "Coplanar and grazing incidence x-ray diffraction investigation of self-organized SiGe quantum dot multilayers", Phys. Rev. B, 58, 7934-7943 (1998); ISSN-No. 0163-1829"
Original Titel:
Coplanar and grazing incidence x-ray diffraction investigation of self-organized SiGe quantum dot multilayers
Sprache des Titels:
Englisch
Journal:
Physical Review B: Condensed Matter and Materials Physics
Erscheinungsjahr:
1998
Notiz zum Zitat:
"V. Holy, A.A. Darhuber, J. Stangl, S. Zerlauth, F. Schäffler, G. Bauer, N. Darowski, D. Lübbert, U. Pietsch, I. Vavra: "Coplanar and grazing incidence x-ray diffraction investigation of self-organized SiGe quantum dot multilayers", Phys. Rev. B, 58, 7934-7943 (1998); ISSN-No. 0163-1829"
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-