Günther Bauer, A. A. Darhuber, J. Grim, Vaclav Holy, J. Kubena, Stefan Zerlauth,
"X-ray reflection from self-organized interfaces in a SiGe/Si multilayer"
, in Semiconductor Science and Technology, 1999, J. Grim, V. Holy, J. Kubena, A.A.Darhuber, G. Bauer, S. Zerlauth: "X-ray reflection from self-organized interfaces in a SiGe/Si multilayer", Semiconductor Science and Technology 14, 32-40 (1999)
Original Titel:
X-ray reflection from self-organized interfaces in a SiGe/Si multilayer
Sprache des Titels:
Englisch
Journal:
Semiconductor Science and Technology
Erscheinungsjahr:
1999
Notiz zum Zitat:
J. Grim, V. Holy, J. Kubena, A.A.Darhuber, G. Bauer, S. Zerlauth: "X-ray reflection from self-organized interfaces in a SiGe/Si multilayer", Semiconductor Science and Technology 14, 32-40 (1999)
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-