Günther Bauer, A. A. Darhuber, J. Grim, Vaclav Holy, J. Kubena, Stefan Zerlauth,
""X-ray reflection from self-organized interfaces in a SiGe/Si multilayer""
, 1999, J. Grim, V. Holy, J. Kubena, A.A.Darhuber, G. Bauer, S. Zerlauth: "X-ray reflection from self-organized interfaces in a SiGe/Si multilayer", Semiconductor Science and Technology 14, 32-40 (1999)
Original Titel:
"X-ray reflection from self-organized interfaces in a SiGe/Si multilayer"
Sprache des Titels:
Englisch
Englischer Titel:
X-ray reflection from self-organized interfaces in a SiGe/Si multilayer
Erscheinungsjahr:
1999
Notiz zum Zitat:
J. Grim, V. Holy, J. Kubena, A.A.Darhuber, G. Bauer, S. Zerlauth: "X-ray reflection from self-organized interfaces in a SiGe/Si multilayer", Semiconductor Science and Technology 14, 32-40 (1999)
Anzahl der Seiten:
0
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-