Günther Bauer, H. Kibbel, Ewald Koppensteiner, K. Lischka, W. Plotz, H. Presting,
" An investigation of x-ray reflectivity and -diffraction from electroluminescent short period Si-Ge superlattice structures "
, in Semiconductor Science and Technology, 1995, ISSN: 0268-1242, W.M. Plotz, E. Koppensteiner, H. Kibbel, H. Presting, G. Bauer, K. Lischka: "An investigation of x-ray reflectivity and -diffraction from electroluminescent short period Si-Ge superlattice structures", Semicond. Sci. Technol. 10, 1614 (1995), ISSN-Number 0268-1242
Original Titel:
An investigation of x-ray reflectivity and -diffraction from electroluminescent short period Si-Ge superlattice structures
Sprache des Titels:
Englisch
Journal:
Semiconductor Science and Technology
Erscheinungsjahr:
1995
Notiz zum Zitat:
W.M. Plotz, E. Koppensteiner, H. Kibbel, H. Presting, G. Bauer, K. Lischka: "An investigation of x-ray reflectivity and -diffraction from electroluminescent short period Si-Ge superlattice structures", Semicond. Sci. Technol. 10, 1614 (1995), ISSN-Number 0268-1242
Forschungs-