Günther Bauer, C. Pichler, Gunther Springholz,
""A comparison of experimental resolution for critical thickness determination by UHV-STM, x-ray diffraction and in situ RHEED""
, 1995, C. Pichler, G. Springholz, G. Bauer: "A comparison of experimental resolution for critical thickness determination by UHV-STM, x-ray diffraction and in situ RHEED", In: "Semiconductor Heteroepitaxy: Growth, Characterization and Device Applications", eds.: B. Gil, R.-L. Aulombard. World Scientific Publishing, Singapore 1995, p. 222.
Original Titel:
"A comparison of experimental resolution for critical thickness determination by UHV-STM, x-ray diffraction and in situ RHEED"
Sprache des Titels:
Englisch
Englischer Titel:
A comparison of experimental resolution for critical thickness determination by UHV-STM, x-ray diffraction and in situ RHEED
Erscheinungsjahr:
1995
Notiz zum Zitat:
C. Pichler, G. Springholz, G. Bauer: "A comparison of experimental resolution for critical thickness determination by UHV-STM, x-ray diffraction and in situ RHEED", In: "Semiconductor Heteroepitaxy: Growth, Characterization and Device Applications", eds.: B. Gil, R.-L. Aulombard. World Scientific Publishing, Singapore 1995, p. 222.
Anzahl der Seiten:
0
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-