Günther Bauer, H.-J. Herzog, Vaclav Holy, J. H. Li, Friedrich Schäffler,
"Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content"
, in Journal of Applied Physics, 1995, ISSN: 0021-8979, V. Holy, J.H. Li, G. Bauer, F. Sch
ffler, H.-J. Herzog: "Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content", J. Appl. Phys. 78, 5013 (1995), ISSN-Number 0021-8979
Original Titel:
Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content
Sprache des Titels:
Englisch
Journal:
Journal of Applied Physics
Erscheinungsjahr:
1995
Notiz zum Zitat:
V. Holy, J.H. Li, G. Bauer, F. Sch
ffler, H.-J. Herzog: "Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content", J. Appl. Phys. 78, 5013 (1995), ISSN-Number 0021-8979
ISSN:
0021-8979
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-