Günther Bauer, P. Hamberger, E. Kasper, H. Kibbel, Ewald Koppensteiner, A. Pesek, H. Presting,
"X-ray diffraction investigation of single step and step-graded SiGe alloy buffers for the growth of short period SimGen superlattices using reciprocal space mapping"
, in Applied Physics Letters, 1993, ISSN: 0003-6951, E. Koppensteiner, P. Hamberger, G. Bauer, A. Pesek, H. Kibbel, H. Presting, E. Kasper: "X-ray diffraction investigation of single step and step-graded SiGe alloy buffers for the growth of short period SimGen superlattices using reciprocal space mapping", Appl. Phys. Lett. 62, 1783 (1993), ISSN-Number 0003-6951
Original Titel:
X-ray diffraction investigation of single step and step-graded SiGe alloy buffers for the growth of short period SimGen superlattices using reciprocal space mapping
Sprache des Titels:
Englisch
Journal:
Applied Physics Letters
Erscheinungsjahr:
1993
Notiz zum Zitat:
E. Koppensteiner, P. Hamberger, G. Bauer, A. Pesek, H. Kibbel, H. Presting, E. Kasper: "X-ray diffraction investigation of single step and step-graded SiGe alloy buffers for the growth of short period SimGen superlattices using reciprocal space mapping", Appl. Phys. Lett. 62, 1783 (1993), ISSN-Number 0003-6951