W. Faschinger, G.J. Glanner, M.A. Herman, Helmut Sitter,
"Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry"
, in Applied Physics Letters, 1994, ISSN: 0003-6951, G.J. Glanner, H. Sitter, W. Faschinger, M.A. Herman: "Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry", Appl. Phys. Lett. 65, 998 (1994), ISSN-Number 0003-6951
Original Titel:
Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry
Sprache des Titels:
Englisch
Journal:
Applied Physics Letters
Erscheinungsjahr:
1994
Notiz zum Zitat:
G.J. Glanner, H. Sitter, W. Faschinger, M.A. Herman: "Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry", Appl. Phys. Lett. 65, 998 (1994), ISSN-Number 0003-6951