Günther Bauer, P. Hamberger, Vaclav Holy, E. Kasper, H. Kibbel, Ewald Koppensteiner, H. Presting,
"Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction"
, in Solid State Electronics, 1994, E. Koppensteiner, P. Hamberger, G. Bauer, V. Holy, H. Kibbel, H. Presting, E. Kasper: "Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction", Solid State Electronics 37, 629 (1994)
Original Titel:
Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction
Sprache des Titels:
Englisch
Journal:
Solid State Electronics
Erscheinungsjahr:
1994
Notiz zum Zitat:
E. Koppensteiner, P. Hamberger, G. Bauer, V. Holy, H. Kibbel, H. Presting, E. Kasper: "Quantitative analysis of strain relaxation and mosaicity in short period SimGen superlattices using reciprocal space mapping by x-ray diffraction", Solid State Electronics 37, 629 (1994)
Forschungs-