Günther Bauer, N. Frank, Gunther Springholz,
"Imaging of misfit dislocation formation in strained layer heteroepitaxy by ultra high vacuum scanning tunneling microscopy"
: Proceedings of the 22nd International Conference on the Physics of Semiconductors, Vancouver 1994, 1995, N. Frank, G. Springholz, G. Bauer: "Imaging of misfit dislocation formation in strained layer heteroepitaxy by ultra high vacuum scanning tunneling microscopy", Proceedings of the 22nd International Conference on the Physics of Semiconductors, Vancouver 1994, ed.: D.J. Lockwood. World Scientific Publishing, Singapore 1995, p. 652.
Original Titel:
Imaging of misfit dislocation formation in strained layer heteroepitaxy by ultra high vacuum scanning tunneling microscopy
Sprache des Titels:
Englisch
Original Buchtitel:
Proceedings of the 22nd International Conference on the Physics of Semiconductors, Vancouver 1994
Erscheinungsjahr:
1995
Notiz zum Zitat:
N. Frank, G. Springholz, G. Bauer: "Imaging of misfit dislocation formation in strained layer heteroepitaxy by ultra high vacuum scanning tunneling microscopy", Proceedings of the 22nd International Conference on the Physics of Semiconductors, Vancouver 1994, ed.: D.J. Lockwood. World Scientific Publishing, Singapore 1995, p. 652.
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