Helmut Sitter, Klaus Schmidegg, David Stifter, Alberta Bonanni, Gerold Neuwirt,
"In situ optical analysis of low-temperature MOCVD GaN nucleation layer formation via multiple wavelength ellipsometry"
, in Journal of Crystal Growth, Vol. 272, Nummer 1-4, Seite(n) 106-110, 2004, ISSN: 1873-5002
Original Titel:
In situ optical analysis of low-temperature MOCVD GaN nucleation layer formation via multiple wavelength ellipsometry