,
"Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction"
, 5-2002, T. Roch, V. Holy, A. Hesse, J. Stangl, T. Fromherz, G. Bauer, T.H. Metzger, S. Ferrer: Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction, Phys. Rev. B 65, 245324 (2002).
Original Titel:
Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction
Sprache des Titels:
Englisch
Englischer Titel:
Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction
Erscheinungsmonat:
5
Erscheinungsjahr:
2002
Notiz zum Zitat:
T. Roch, V. Holy, A. Hesse, J. Stangl, T. Fromherz, G. Bauer, T.H. Metzger, S. Ferrer: Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction, Phys. Rev. B 65, 245324 (2002).
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-