T. Roch, Vaclav Holy, Anke Hesse, Julian Stangl, Thomas Fromherz, Günther Bauer, Till Hartmut Metzger, S. Ferrer,
"Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction"
, in Physical Review B: Condensed Matter and Materials Physics, Vol. 65, Nummer 24, Seite(n) 245324, 6-2002, T. Roch, V. Holy, A. Hesse, J. Stangl, T. Fromherz, G. Bauer, T.H. Metzger, S. Ferrer: Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction, Phys. Rev. B 65, 245324 (2002).
Original Titel:
Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction
Sprache des Titels:
Englisch
Journal:
Physical Review B: Condensed Matter and Materials Physics
Volume:
65
Number:
24
Seitenreferenz:
245324
Erscheinungsmonat:
6
Erscheinungsjahr:
2002
Notiz zum Zitat:
T. Roch, V. Holy, A. Hesse, J. Stangl, T. Fromherz, G. Bauer, T.H. Metzger, S. Ferrer: Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction, Phys. Rev. B 65, 245324 (2002).