Mojmir Meduna, Vaclav Holy, T. Roch, Günther Bauer, Oliver G. Schmidt, K. Eberl,
"Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices"
, in Semiconductor Science and Technology, Vol. 17, Nummer 5, Seite(n) 480-486, 5-2002, M. Meduna, V. Holy, T. Roch, G. Bauer, O. G. Schmidt, K. Eberl: Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices, Semicond. Sci. Technol. 17, 480-486 (2002).
Original Titel:
Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Sprache des Titels:
Englisch
Journal:
Semiconductor Science and Technology
Volume:
17
Number:
5
Seitenreferenz:
480-486
Erscheinungsmonat:
5
Erscheinungsjahr:
2002
Notiz zum Zitat:
M. Meduna, V. Holy, T. Roch, G. Bauer, O. G. Schmidt, K. Eberl: Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices, Semicond. Sci. Technol. 17, 480-486 (2002).
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