Wolfgang Jantsch, N. Sandersfeld, Friedrich Schäffler, Z. Wilamowski,
"Evidence for screening breakdown near the metal-to-insulator transition in two dimensions"
: Proceedings of the 25th International Conference on the Physics of Semiconductors Part I, Serie Springer Proceedings in Physics, Vol. 87, Seite(n) 859-860, 2001, W. Jantsch, Z. Wilamowski, N. Sandersfeld, F. Schäffler: Evidence for screening breakdown near the metal-to-insulator transition in two dimensions, Proceedings 25th International Conference on the Physics of Semiconductors, Sept. 2000, Osaka, Japan, edited by N. Miura, T. Ando, Berlin Heidelberg New York, Springer 2001, p. 859-860.
Original Titel:
Evidence for screening breakdown near the metal-to-insulator transition in two dimensions
Sprache des Titels:
Englisch
Original Buchtitel:
Proceedings of the 25th International Conference on the Physics of Semiconductors Part I
Serie:
Springer Proceedings in Physics
Volume:
87
Seitenreferenz:
859-860
Erscheinungsjahr:
2001
Notiz zum Zitat:
W. Jantsch, Z. Wilamowski, N. Sandersfeld, F. Schäffler: Evidence for screening breakdown near the metal-to-insulator transition in two dimensions, Proceedings 25th International Conference on the Physics of Semiconductors, Sept. 2000, Osaka, Japan, edited by N. Miura, T. Ando, Berlin Heidelberg New York, Springer 2001, p. 859-860.
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