Günther Bauer, K. Eberl, Vaclav Holy, Mojmir Meduna, T. Roch, Oliver G. Schmidt,
"X-ray reflectivity from self-assembled structures in Ge/Si superlattices"
, in Journal of Physics D: Applied Physics, 2001, M. Meduna, V. Holy, T. Roch, G. Bauer, O. Schmidt, K. Eberl: X-ray reflectivity from self-assembled structures in Ge/Si superlattices, J. Phys. D: Appl. Phys. 34, A193-A196 (2001).
Original Titel:
X-ray reflectivity from self-assembled structures in Ge/Si superlattices
Sprache des Titels:
Englisch
Journal:
Journal of Physics D: Applied Physics
Erscheinungsjahr:
2001
Notiz zum Zitat:
M. Meduna, V. Holy, T. Roch, G. Bauer, O. Schmidt, K. Eberl: X-ray reflectivity from self-assembled structures in Ge/Si superlattices, J. Phys. D: Appl. Phys. 34, A193-A196 (2001).
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-