G. Abstreiter, Günther Bauer, K. Brunner, Vaclav Holy, Mojmir Meduna, T. Roch, Julian Stangl, J. Zhu,
"X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with Atomic Force Microscopy"
, in Journal of Applied Physics, 2001, M. Meduna, V. Holy, T. Roch, J. Stangl, G. Bauer, J. Zhu, K. Brunner, G. Abstreiter: X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with Atomic Force Microscopy, J. Appl. Phys. 89, 4836-4842 (2001).
Original Titel:
X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with Atomic Force Microscopy
Sprache des Titels:
Englisch
Journal:
Journal of Applied Physics
Erscheinungsjahr:
2001
Notiz zum Zitat:
M. Meduna, V. Holy, T. Roch, J. Stangl, G. Bauer, J. Zhu, K. Brunner, G. Abstreiter: X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with Atomic Force Microscopy, J. Appl. Phys. 89, 4836-4842 (2001).
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-