Günther Bauer, A. Daniel, J. Grenzer, Friedrich Schäffler, Christoph Schelling, S. Senz, Y. Zhuang,
"Optical and structural properties of Si/SiGe wires grown on patterned Si substrates"
, in Thin Solid Films , 2000, Y. Zhuang, A. Daniel, C. Schelling, F. Schäffler, G. Bauer, J. Grenzer, S. Senz: Optical and structural properties of Si/SiGe wires grown on patterned Si substrates, Thin Solid Films 380, 51-53 (2000).
Original Titel:
Optical and structural properties of Si/SiGe wires grown on patterned Si substrates
Sprache des Titels:
Englisch
Journal:
Thin Solid Films
Erscheinungsjahr:
2000
Notiz zum Zitat:
Y. Zhuang, A. Daniel, C. Schelling, F. Schäffler, G. Bauer, J. Grenzer, S. Senz: Optical and structural properties of Si/SiGe wires grown on patterned Si substrates, Thin Solid Films 380, 51-53 (2000).