R. Pavelka, I. Ohlidal, Jan Hlavka, D. Franta, Helmut Sitter,
"Optical characterization of thin films with randomly rough boundaries using the photovoltage method"
, in Thin Solid Films, Vol. 366, Nummer 1-2, Seite(n) 43-50, 5-2000, R. Pavelka, I. Ohlidal, J. Hlavka, D. Franta, H. Sitter Optical characterization of thin films with randomly rough boundaries using the photovoltage method Thin Solid Films 336, 43 (2000)
Original Titel:
Optical characterization of thin films with randomly rough boundaries using the photovoltage method
Sprache des Titels:
Englisch
Journal:
Thin Solid Films
Volume:
366
Number:
1-2
Seitenreferenz:
43-50
Erscheinungsmonat:
5
Erscheinungsjahr:
2000
Notiz zum Zitat:
R. Pavelka, I. Ohlidal, J. Hlavka, D. Franta, H. Sitter Optical characterization of thin films with randomly rough boundaries using the photovoltage method Thin Solid Films 336, 43 (2000)
Forschungs-