PEEM during organic thin film growth: Making the most of it
Sprache des Vortragstitels:
Englisch
Original Tagungtitel:
10th international Workshop on Surface Physics
Sprache des Tagungstitel:
Englisch
Original Kurzfassung:
PEEM during organic thin film growth: making the most of it
Thorsten Wagner1, Robert G. Heller1, M. Györök1, Grazyna Antczak2, B?a?ej Go?yszny2, Peter Zeppenfeld1
1 Institute of Experimental Physics, Johannes Kepler University, Linz, Austria
2 Institute of Experimental Physics, University of Wroc?aw, Wroc?aw, Poland
Photoelectron emission microscopy (PEEM) is a versatile tool for studying the adsorption of organic molecules on metallic surfaces and thus the growth of ultrathin films in situ, in real space, and in real time. In this presentation, we will show how to make the most of single images and entire movies taken during and after the deposition of ultrathin films formed by hydrogen- and fluorine-terminated phthalocyanine molecules: Transients in the mean electron yield can be related to local changes in the work function of the sample due to adsorption of the molecules via the Fowler-DuBridge theory. [1] The evolution of the standard deviation obtained for a series of images can be used to identify the transition from a pure 2D molecular gas phase to condensed structures in equilibrium with the 2D gas phase. [2] Since most of the photoelectrons are excited in the substrate, we can measure the electron attenuation for a single layer of phthalocyanine molecules. [1]
However, not all photons are absorbed and contribute to the photoemission. Therefore, synchronous recording of optical reflectance as a function of photon energy and polarization state (DRS/DDRS) during growth provides valuable and complementary information.
[1] Th. Wagner et al., ACS Appl. Mater. Interfaces 12 (2022), 23983-23989
[2] Th. Wagner et al., Ultramicroscopy 233 (2022), 113427
Sprache der Kurzfassung:
Englisch
Vortragstyp:
Hauptvortrag / Eingeladener Vortrag auf einer Tagung
Forschungs-