Simulating Defects in Environmental Sensor Networks Using Stochastic Sensor Models
Sprache des Vortragstitels:
Englisch
Original Tagungtitel:
International Symposium on Sensor Science
Sprache des Tagungstitel:
Englisch
Original Kurzfassung:
Chemiresistive gas sensors are an important tool for monitoring air quality in cities and
large areas due to their low cost and low power and, hence, the ability to densely distribute them.
Unfortunately, such sensor systems are prone to defects and faults over time such as sensitivity loss of
the sensing material, less effective heating of the surface due to battery loss, or random output errors
in the sensor electronics, which can lead to signal jumps or sensor stopping. Although these defects
usually can be compensated, either algorithmically or physically, this requires an accurate screening
of the entire sensor system for such defects. In order to properly develop, test, and benchmark
corresponding screening algorithms, however, methods for simulating gas sensor networks and
their defects are essential. In this work, we propose such a simulation method based on a stochastic
sensor model for chemiresistive sensor systems. The proposed method rests on the idea of simulating
the defect-causing processes directly on the sensor surface as a stochastic process and is capable of
simulating various defects which can occur in low-cost sensor technologies. The work aims to show
the scope and principles of the proposed simulator as well as to demonstrate its applicability using
exemplary use cases.