Usage of ESD Detector Circuit for Analyzing Soft Failu res in IC cores
Sprache des Vortragstitels:
2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)
Sprache des Tagungstitel:
Due to ESD events on powered ICs, soft failures can occur in the IO pad frame and in the core of the IC. A detector cell can be used to detect these faults and distinguish between valid signal changes and soft failures. A corresponding digital detector cell with adjusted switching thresholds is presented in this paper. Since the detector cell is correspondingly small (150?m × 16.5?m), it can be placed several times in the IC and read out via a scan chain.