Roland Steinberger, J. Sicking, J. Weise, Jiri Duchoslav, T. Greunz, D.C. Meyer, David Stifter,
"Chemical degradation of selected Zn-based corrosion products induced by C60 cluster, Ar cluster and Ar+ ion sputtering in the focus of X-ray photoelectron spectroscopy (XPS)"
, in Applied Surface Science, Vol. 403, Seite(n) 15-22, 2017, ISSN: 1873-5584
Original Titel:
Chemical degradation of selected Zn-based corrosion products induced by C60 cluster, Ar cluster and Ar+ ion sputtering in the focus of X-ray photoelectron spectroscopy (XPS)