Self-Adaptive Evolving Forecast Models with Incremental PLS Space Update for On-line Predicting Quality of Micro-fluidic Chips
Sprache des Titels:
An important predictive maintenance task in modern production systems is to predict the quality of products
in order to be able to intervene at an early stage to avoid faults and waste. Here, we address the prediction
of the most important quality criteria in micro-fluidics chips. Due to semi-manual inspection, these quality
criteria are typically measured only intermittently. This leads to a high-dimensional batch process modeling
problem with the goal of predicting chip quality based on the trends in these process values (time series). We
apply time-series based transformation for dimension reduction to the lagged time-series space using of partial
least squares (PLS), and combine this with a generalized form of Takagi?Sugeno (TS) fuzzy systems to obtain a
non-linear PLS forecast model (termed as PLS-fuzzy). The rule consequent functions are robustly estimated by
a weighted regularization scheme based on the idea of the elastic net approach. To address particular system
dynamics over time, we propose dynamic updating of the non-linear PLS-fuzzy models using new on-line timeseries
data, with the options 1.) adapt and evolve the rule base on the fly, 2.) smoothly down-weight older samples
to increase flexibility of the fuzzy models, and 3.) update the PLS space by incrementally adapting the loading
vectors, where processing is achieved in a single-pass stream mining manner. We call our method IPLS-GEFS
(incremental PLS combined with generalized evolving fuzzy systems).
The results show that there is significant non-linearity in the predictive modeling problem, as the non-linear
PLS-fuzzy modeling approach significantly outperformed classical PLS for most of the targets (quality criteria).
Reliable predictions of flatness quality (with around 10% error) and of RMSE values and transmissions (with around 15% errors) can be achieved with prediction horizons of up to
4 to 5 h into the future.
Sprache der Kurzfassung:
Engineering Applications of Artificial Intelligence