High-resolution x-ray diffraction of epitaxial bismuth chalcogenide topological insulator layers
Sprache des Titels:
Englisch
Original Kurzfassung:
Stoichiometry and lattice structure of epitaxial layers of topological insulators Bi2Te3 and Bi2Se3 grown by molecular-beam epitaxy is studied by high-resolution x-ray diffraction. We show that the stoichiometry of Bi2X3 ? ? (X??=??Te, Se) epitaxial layers depends on the additional flux of the chalcogens Te or Se during growth. If no excess flux is employed, the resulting structure is very close to Bi1X1 (???=??1), whereas with a high excess flux the stoichiometric Bi2X3 phase is obtained. From the x-ray data we determined the lattice parameters of the layers and their dependence on composition ?, as well as the degree of crystal quality of the layers.
Sprache der Kurzfassung:
Englisch
Journal:
Advances in Natural Sciences: Nanoscience and Nanotechnology
Forschungs-