Günther Bauer, D. Bimberg, A. A. Darhuber, Marius Grundmann, F. Heinrichsdorff, Vaclav Holy, P.S. Kop'ev, A. Krost, Julian Stangl, V.M. Ustinov,
"Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity"
: Proc. 23rd International Conference on the Physics of Semiconductors, Berlin, Germany, 1996, A.A. Darhuber, J. Stangl, V. Holy, G. Bauer, A. Krost, F. Heinrichsdorff, M. Grundmann, D. Bimberg, V.M. Ustinov, P.S. Kop'ev: "Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity", Proc. 23rd International Conference on the Physics of Semiconductors, Berlin, Germany, July 21-26, 1996, World Scientific Publishing, Singapore 1996, p. 1293-1296
Original Titel:
Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity
Sprache des Titels:
Englisch
Original Buchtitel:
Proc. 23rd International Conference on the Physics of Semiconductors, Berlin, Germany
Erscheinungsjahr:
1996
Notiz zum Zitat:
A.A. Darhuber, J. Stangl, V. Holy, G. Bauer, A. Krost, F. Heinrichsdorff, M. Grundmann, D. Bimberg, V.M. Ustinov, P.S. Kop'ev: "Structural characterization of single and multiple layers of self-assembled InGaAs quantum dots by high resolution x-ray diffraction and reflectivity", Proc. 23rd International Conference on the Physics of Semiconductors, Berlin, Germany, July 21-26, 1996, World Scientific Publishing, Singapore 1996, p. 1293-1296
Forschungs-