Michael Bergmair, Kurt Hingerl, Peter Zeppenfeld,
"Spectroscopic ellipsometry on metallic gratings"
, in Univ.-Prof. Dr. Kurt Hingerl: Ellipsometry at the Nanoscale, Serie Ellipsometry at the Nanoscale, Vol. 24, Springer, Heidelberg, Seite(n) 257, 3-2013, ISBN: 978-3-642-33955-4