A. Kozanecki, C. Jeynes, B. J. Sealy, Wolfgang Jantsch, Sven Lanzerstorfer, Wolfgang Johann Heiß, Gerhard Prechtl,
"Photoluminescence and Backscattering Characterization of 6H SiC Implanted with Erbium and Oxygen Ions"
, in Materials Science Forum, Vol. 264-268, Seite(n) 501-504, 1998, A. Kozanecki, C. Jeynes, B.J. Sealy, W. Jantsch, S. Lanzerstorfer, W. Heiss, G. Prechtl: Photoluminescence and Backscattering Characterization of 6H SiC Implanted with Erbium and Oxygen Ions, Mat. Sci. Forum 264-268, 501-504 (1998)
Original Titel:
Photoluminescence and Backscattering Characterization of 6H SiC Implanted with Erbium and Oxygen Ions
Sprache des Titels:
Englisch
Journal:
Materials Science Forum
Volume:
264-268
Seitenreferenz:
501-504
Erscheinungsjahr:
1998
Notiz zum Zitat:
A. Kozanecki, C. Jeynes, B.J. Sealy, W. Jantsch, S. Lanzerstorfer, W. Heiss, G. Prechtl: Photoluminescence and Backscattering Characterization of 6H SiC Implanted with Erbium and Oxygen Ions, Mat. Sci. Forum 264-268, 501-504 (1998)