Calibration of a Flexible High Precision Power-On Reset during Production Test
Sprache des Titels:
International Test Conference 2012
This paper describes a Power-On Reset (POR) circuit with
very accurate threshold voltage levels. These voltage levels
are achieved by calibrating an on-chip programmable
voltage reference during the wafer sort or ?nal test.
Two different calibration methods are proposed. One
which calibrates the reference voltage of a comparator
and another method which calibrates the POR threshold
voltage levels itself.
Not only the variation of the POR threshold voltage levels
can be reduced from 90mV to 7mV, but also the absolute
value can be changed.