Christian Wicpalek, Thomas Mayer, Linus Maurer, Ulrich Vollenbruch, Yue Liu, Andreas Springer,
"Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator"
: Proc. International Microwave Symposium (IMS 2007), Seite(n) 2205-2208, 2007, ISBN: 1-4244-0688-9
Original Titel:
Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator
Sprache des Titels:
Englisch
Original Buchtitel:
Proc. International Microwave Symposium (IMS 2007)
Original Kurzfassung:
A Frequency Discriminator in All-Digital Phase Locked Loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UMTS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 μm CMOS technology.
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