Inverse pattern design for profilometric measurement
methods based upon the inversion of a distorted fringe pattern caused
by a reference object is a common technique for both mirror–like surfaces
and surfaces with diffuse reflection behavior. This paper proposes
the calculation of an inverted pattern for analytically known
reference objects based upon ray tracing techniques. Thus, a manufactured
reference object with an associated reference fringe pattern
is no longer required to fully reconstruct object shapes.