A test-chip to characterize the benefit of on-chip decoupling to reduce the electromagnetic emission of integrated circuits
Sprache des Titels:
Proceedings of the 2003 IEEE International Symposium on Electromagnetic Compatibility (EMC)
In this paper we present two test-chips, which were used to characterize the influence of the placement of on-chip decoupling capacitor blocks on the electromagnetic emission of integrated circuits. In general the electromagnetic emission could be reduced by the use of on-chip capacitors, but also an increase of the emission is possible, when these capacitors are not optimally placed.