Klaus Schmidegg, Alberta Bonanni, Helmut Sitter,
"In-situ optical analysis of low temperature MOCVD GaN nucleation layer formation via multiple wavelength ellipsometry"
, in Journal of Crystal Growth, Vol. 272, 2004
Original Titel:
In-situ optical analysis of low temperature MOCVD GaN nucleation layer formation via multiple wavelength ellipsometry
Forschungs-