A. Daniel, Vaclav Holy, Y. Zhuang, Julian Stangl, T. Roch, Günther Bauer, J. Grenzer, Z. Bochnicek,
"X-ray diffraction study of lateral strain modulations in Si substrates arising from patterned periodic SiO2 stripes"
, in Physical Review B, 2001, A. Daniel, V. Holy, Y. Zhuang, J. Stangl, T. Roch, G. Bauer, J. Grenzer, Z. Bochnicek: "X-ray diffraction study of lateral strain modulations in Si substrates arising from patterned periodic SiO2 stripes", Phys. Rev. B, submitted.
Original Titel:
X-ray diffraction study of lateral strain modulations in Si substrates arising from patterned periodic SiO2 stripes
Sprache des Titels:
Englisch
Journal:
Physical Review B
Erscheinungsjahr:
2001
Notiz zum Zitat:
A. Daniel, V. Holy, Y. Zhuang, J. Stangl, T. Roch, G. Bauer, J. Grenzer, Z. Bochnicek: "X-ray diffraction study of lateral strain modulations in Si substrates arising from patterned periodic SiO2 stripes", Phys. Rev. B, submitted.
Reichweite:
international
Publikationstyp:
Aufsatz / Paper in sonstiger referierter Fachzeitschrift
Forschungs-