Title:Graphite oxide Auger-electron diagnosticsAuthor(s):V. M. Mikoushkin, A. S. Kriukov, V. V. Shnitov, A. P. Solonitsyna, A. T. Dideykin, D. A. Sakseev, O. Yu. Vilkov, Ventsislav LavchievAbstract:Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (C OH) and epoxide (C O C). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.Journal:Journal of Electron Spectroscopy and Related PhenomenaPublisher:ELSEVIERISSN:1873-2526Page Reference:page 51-55, 5 page(s)Publishing:1/2015Number:199