Title:SUltrasonic defect detection in multi-material, axis-symmetric devices with an improved synthetic aperture focusing technique (SAFT)Author(s):T. Scharrer,  A. Koch,  K. T. Fendt,  Stefan Rupitsch,  A. Sutor,  H. Ermert,  Reinhard LerchBooktitle:Proc. IEEE Ultrasonics SymposiumPage Reference:999 page(s)Publishing:12/2012

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