Title:SUltrasonic defect detection in multi-material, axis-symmetric devices with an improved synthetic aperture focusing technique (SAFT)Author(s):T. Scharrer, A. Koch, K. T. Fendt, Stefan Rupitsch, A. Sutor, H. Ermert, Reinhard LerchBooktitle:Proc. IEEE Ultrasonics SymposiumPage Reference:999 page(s)Publishing:12/2012