D. Krecar, M. Rosner, H. Hutter, Peter Bauer, Markus Draxler,
"Quantitative analysis of the Ge concentration in a SiGe quantum well: comparision of low-energy RBS and SIMS measurements"
, in Analytical and Bioanalytical Chemistry, Vol. 384, Nummer 2, Seite(n) 525-539, 2006, ISSN: 1618-2642
Original Titel:
Quantitative analysis of the Ge concentration in a SiGe quantum well: comparision of low-energy RBS and SIMS measurements